產(chǎn)品詳情
TEKBOX TBPS01-TBWA2/20dB EMC近場探頭組件TBPS01
品牌：TEKBOX
類別：EMC近場探頭組件
型號：TBPS01-TBWA2/20dB
產(chǎn)品簡介：
近場探頭無疑是調(diào)試EMC問題的最有效工具。近場探頭用于定位射頻發(fā)射源以及易受射頻影響的電路。在選擇EMC預合規(guī)性測試設備時，近場探頭應放在首位。
探頭通常連接到頻譜分析儀，其功能類似于寬帶天線。在PCB組件、外殼孔或間隙、電纜和產(chǎn)品的任何其他組件的表面上掃描探頭，可以快速識別出發(fā)射電磁輻射的區(qū)域。通過更換更小的探頭，可以進一步縮小排放源。
射頻抗擾度測試還可以通過將射頻信號注入探頭并將其輻射到可能易受攻擊的電路部分來進行：此外，通過非接觸式監(jiān)測射頻信號電平，探頭可用于維修或調(diào)試領(lǐng)域，以找出射頻信號鏈中的故障。射頻構(gòu)建塊（如調(diào)制器或振蕩器）的非侵入性測量是另一種應用。低噪聲前置放大器可用于測量頻率、相位噪聲和頻譜分量。
TBPS01套件包括磁場探頭H20、H10和H5，以及電場探頭E5和同軸電纜和適配器，用于帶N或SMA連接器的頻譜分析儀。
TBPS01-TBWA/20dB和TBPS01-TBWA2/40dB組增加了6GHz寬帶前置放大器。
TBWA2/20dB和TBWA2/40db寬帶放大器連接在探頭和頻譜分析儀之間，以增加測量的動態(tài)范圍，特別是在較低頻率下。
TBPS01-TBWA2/20dB - EMC Near-field Probe Set + 20dB Wideband Amplifier
TBPS01-TBWA2/20dB-EMC近場探頭組+20dB寬帶放大器
這些探頭用于電磁輻射源的近場。
它們用于定位和識別電子組件構(gòu)建塊內(nèi)的潛在干擾源。
The H20, H10, H5 and E5 are magnetic field (H) and electric field (E) probes for radiated emissions EMC pre-compliance measurements.
The probes are used in the near field of sources of electromagnetic radiation. They serve to locate and
identify potential sources of interference within the building blocks of electronic assemblies.
The probes act similar as wide bandb antennas, picking up radiated emissions from components,
PCB traces, housing openings or gaps and from any other parts that could be emitting RF.
The probes are usually connected to a spectrum analyzer. Scanning the probe over the surface of a
PCB assembly or housing quickly identifies bs which emit electromagnetic radiation.
By changing to a probe with smaller size, the origination of the emissions can be further narrowed
down. Additional applications are RF immunity tests by feeding a RF signal into the probe and
radiating it into potentially susceptible circuit sections: Furthermore the probes can be used in the
field of repair or debugging to track down issues in RF signal chains by contact less measurement
of RF signal levels. One more application is non- invasive measurement of RF building blocks such
as modulators or oscillators. Frequency, phase noise and spectral components can be measured in
conjunction with a low noise preamplifier.
Every set includes a SMB to SMA cable (0.75m)
其它相關(guān)產(chǎn)品：
TBPS01 - EMC Near-field Probe Set
TBPS01-TBWA2/40dB - EMC Near-field Probe Set + 40dB Wideband Amplifier
TBPS01-TBWA2/20dB - EMC Near-field Probe Set + 20dB Wideband Amplifier
TBMDA1 - Modulated Wideband Driver Amplifier
Wideband amplifier set, 1 TBWA2/20dB, 1 TBWA/40dB
TBWA2/40dB - 40dB Wideband Amplifier
TBHDR1 - High Dynamic Range Amplifier
品牌：TEKBOX
類別：EMC近場探頭組件
型號：TBPS01-TBWA2/20dB
產(chǎn)品簡介：
近場探頭無疑是調(diào)試EMC問題的最有效工具。近場探頭用于定位射頻發(fā)射源以及易受射頻影響的電路。在選擇EMC預合規(guī)性測試設備時，近場探頭應放在首位。
探頭通常連接到頻譜分析儀，其功能類似于寬帶天線。在PCB組件、外殼孔或間隙、電纜和產(chǎn)品的任何其他組件的表面上掃描探頭，可以快速識別出發(fā)射電磁輻射的區(qū)域。通過更換更小的探頭，可以進一步縮小排放源。
射頻抗擾度測試還可以通過將射頻信號注入探頭并將其輻射到可能易受攻擊的電路部分來進行：此外，通過非接觸式監(jiān)測射頻信號電平，探頭可用于維修或調(diào)試領(lǐng)域，以找出射頻信號鏈中的故障。射頻構(gòu)建塊（如調(diào)制器或振蕩器）的非侵入性測量是另一種應用。低噪聲前置放大器可用于測量頻率、相位噪聲和頻譜分量。
TBPS01套件包括磁場探頭H20、H10和H5，以及電場探頭E5和同軸電纜和適配器，用于帶N或SMA連接器的頻譜分析儀。
TBPS01-TBWA/20dB和TBPS01-TBWA2/40dB組增加了6GHz寬帶前置放大器。
TBWA2/20dB和TBWA2/40db寬帶放大器連接在探頭和頻譜分析儀之間，以增加測量的動態(tài)范圍，特別是在較低頻率下。
TBPS01-TBWA2/20dB - EMC Near-field Probe Set + 20dB Wideband Amplifier
TBPS01-TBWA2/20dB-EMC近場探頭組+20dB寬帶放大器
這些探頭用于電磁輻射源的近場。
它們用于定位和識別電子組件構(gòu)建塊內(nèi)的潛在干擾源。
The H20, H10, H5 and E5 are magnetic field (H) and electric field (E) probes for radiated emissions EMC pre-compliance measurements.
The probes are used in the near field of sources of electromagnetic radiation. They serve to locate and
identify potential sources of interference within the building blocks of electronic assemblies.
The probes act similar as wide bandb antennas, picking up radiated emissions from components,
PCB traces, housing openings or gaps and from any other parts that could be emitting RF.
The probes are usually connected to a spectrum analyzer. Scanning the probe over the surface of a
PCB assembly or housing quickly identifies bs which emit electromagnetic radiation.
By changing to a probe with smaller size, the origination of the emissions can be further narrowed
down. Additional applications are RF immunity tests by feeding a RF signal into the probe and
radiating it into potentially susceptible circuit sections: Furthermore the probes can be used in the
field of repair or debugging to track down issues in RF signal chains by contact less measurement
of RF signal levels. One more application is non- invasive measurement of RF building blocks such
as modulators or oscillators. Frequency, phase noise and spectral components can be measured in
conjunction with a low noise preamplifier.
Every set includes a SMB to SMA cable (0.75m)
其它相關(guān)產(chǎn)品：
TBPS01 - EMC Near-field Probe Set
TBPS01-TBWA2/40dB - EMC Near-field Probe Set + 40dB Wideband Amplifier
TBPS01-TBWA2/20dB - EMC Near-field Probe Set + 20dB Wideband Amplifier
TBMDA1 - Modulated Wideband Driver Amplifier
Wideband amplifier set, 1 TBWA2/20dB, 1 TBWA/40dB
TBWA2/40dB - 40dB Wideband Amplifier
TBHDR1 - High Dynamic Range Amplifier
